X-ray diffraction is one of the principal technics for characterization of microstructures crystaline materials, finding applications in diverse fields of knowledge, but particularily in engineering and material sciences, metalurgical engineering, chemistry and mining, along with the geosciences, among others.
The diffraction standards obtained were compared with the basic crystalographic registers básicos that make up the International Centre for Diffraction Data (ICDD) database available with the software of the equipment.
